ISS global analytical network connecting research centers and technology partners around the world

Global Insight. Real-World Impact.

Advanced analysis for the systems people rely on every day.

ISS Analytical Research Centers help engineers understand the materials, devices and physical evidence behind safer transportation, reliable aviation, cleaner energy, advanced computing and the technologies shaping modern life.

Operational Performance

Built for consistent, high-volume analytical work.

Our production workflow is designed to move samples quickly while maintaining the quality and repeatability complex analytical work requires.

20,000+

Annual Capacity

Annual semiconductor sample-processing capacity.

10,112+ YTD

Samples Processed

Samples processed year to date.

22 hr

Average Turnaround

Average sample turnaround time (TAT).

3%

Rework Rate

Current average rework rate.

Start with the question.

Your sample. Your question. Our job is to find the answer.

Capabilities

What ISS provides.

Six integrated service lines support semiconductor engineering from physical access and high-resolution imaging through measurement, failure analysis, circuit modification and authorized hardware assurance.

TEM and diffraction capability overview

Not sure where to start?

Tell us the engineering question. We will build the workflow.

Submit a Project

Technologies

The right technique for the right question.

ISS combines imaging, preparation, spectroscopy, diffraction, metrology and analytical workflows to reveal structure, composition, dimensions and failure evidence across multiple scales.

ISS analytical technologies collage

Analytical Technologies

From rapid inspection to nanoscale characterization.

Optical Microscopy

Rapid visual inspection and documentation for surface features, defects, contamination, and sample condition prior to advanced analysis.

SEM

High-resolution surface imaging for morphology, defects, structures, particles, and semiconductor device characterization across a wide range of sample types.

CD Metrology

Precise dimensional measurement of critical features for process monitoring, device characterization, and semiconductor manufacturing support.

FIB / FIB-SEM

Site-specific cross-sectioning, material removal, circuit access, and advanced sample preparation using focused ion beam and dual-beam microscopy.

TEM / STEM

Atomic- and nanoscale imaging for detailed structural, defect, interface, and materials analysis using transmission and scanning transmission electron microscopy.

EDS

Elemental identification and compositional analysis through energy-dispersive X-ray spectroscopy, including point analysis, line scans, and elemental mapping.

EBSD

Crystallographic analysis for phase identification, grain orientation, texture, grain boundaries, and microstructural characterization.

EELS

Advanced chemical and electronic structure analysis at the nanoscale using electron energy-loss spectroscopy in the TEM/STEM.

3D Tomography

Three-dimensional reconstruction of internal structures, interfaces, defects, and material distributions using sequential imaging and computational reconstruction.

What do you need to know?

Start with the information you need.

Technique Comparison

How the technologies complement one another.

TechniqueBest ForStructural InfoChemical InfoDimensional Data

One question may require more than one tool.

Start with the question. We will select the technology.

Submit a Project

Industries

Analytical insight across advanced industries.

From semiconductor devices and AI infrastructure to energy systems, advanced materials and emerging research markets, ISS combines microscopy, characterization, metrology and engineering analysis to answer complex physical questions.

ISS industries

Markets We Serve

Start with your industry. We will build the analytical path.

Connected Network

Industry expertise mapped to specialized ARC capabilities.

ISS is building each Analytical Research Center around a distinct technical role. Semiconductor and materials work is anchored by Vancouver; Queen Creek expands modification, characterization and security; future centers extend the network into materials research, geological research and biological sciences.

Start with the market and the question.

ISS will route the work to the right capability and research center.

Submit a Project

Common Analysis Challenges

Start with the problem you need to solve.

You do not need to know the instrument or analytical method before contacting ISS. Start with the physical question, failure signature or measurement challenge. ISS will build the analytical path around the evidence required.

Failure chain from real-world system to device to microscopic defect

Common Challenges

From visible defects to nanoscale evidence.

Voiding & Porosity microscopy example

Voiding & Porosity

Locate and quantify voids in packages, interfaces, films, solder structures and advanced materials.

Delamination & Interface Failure microscopy example

Delamination & Interface Failure

Evaluate separation, weak bonding, interface quality and failure propagation across layered structures.

Cracking & Fracture microscopy example

Cracking & Fracture

Identify crack initiation, propagation paths and surrounding structural evidence in devices, packages and materials.

Contamination & Foreign Material microscopy example

Contamination & Foreign Material

Locate particles or unexpected material and determine elemental composition with microscopy and spectroscopy.

Critical Dimensions microscopy example

Critical Dimensions

Measure linewidths, spacing, pitch, vias, trenches and other customer-defined geometric features.

Layer & Film Thickness microscopy example

Layer & Film Thickness

Quantify thin films, multilayer stacks, barriers, coatings and complex interfaces from SEM through TEM/STEM.

Interface Analysis microscopy example

Interface Analysis

Characterize bonding, morphology, chemistry and structural transitions across critical interfaces.

Elemental Identification microscopy example

Elemental Identification

Use EDS and related analytical methods to identify composition and map elemental distributions.

Failure Localization microscopy example

Failure Localization

Move from system-level symptom to the physical region requiring higher-resolution investigation.

Device Modification & Circuit Edit microscopy example

Device Modification & Circuit Edit

Physically alter or access circuitry to test hypotheses, isolate paths and support engineering debug.

Suspect vs. Control Comparison microscopy example

Suspect vs. Control Comparison

Compare failing or abnormal material against known-good devices, structures or process conditions.

Unknown Physical Defect microscopy example

Unknown Physical Defect

When the failure mode is unclear, ISS can build a staged workflow to preserve evidence and escalate resolution as needed.

How ISS Approaches the Problem

Question first. Technique second.

01 · DEFINE

Start with the engineering question

Describe the symptom, device, sample condition and what decision the analysis needs to support.

02 · LOCALIZE

Preserve context and identify the region

Use optical, SEM, electrical context or prior evidence to narrow the investigation.

03 · CHARACTERIZE

Escalate only as needed

Move through FIB-SEM, TEM/STEM, EDS/EELS, metrology or circuit edit based on the evidence required.

04 · INTERPRET

Connect evidence to the decision

Compare, measure and document the physical result in a form engineers can act on.

Not sure what technique you need?

Tell us the problem. ISS will build the analytical path.

Submit a Project

ISS Analytical Research Centers

A national network for advanced analytical research.

ISS Analytical Research Centers bring specialized microscopy, analysis, modification and physical-device assurance closer to the engineering teams that need them. Each ARC shares a common ISS operating model while developing a distinct technical specialization.

United States map highlighting ISS ARC locations in Washington, Arizona, Texas, Minnesota and North Carolina

The ARC Network

Specialized centers. One integrated ISS network.

Vancouver Washington waterfront and skyline
Vancouver skyline photo: RodSager64 / CC BY-SA 4.0
ARC01 · Active

Vancouver, Washington

Flagship Analytical Research Center

Vancouver is the structural-analysis and failure-investigation hub of the ARC network, combining site-specific access, quantitative measurement and high-resolution microscopy.

FIB-SEMMetrologyFailure AnalysisTEM-STEM
Queen Creek Arizona and San Tan Mountain landscape
Queen Creek / San Tan Mountains photo: CWanamaker / CC BY 3.0
ARC02 · Planned

Queen Creek, Arizona

Planned Analytical Research Center

Queen Creek is planned as the modification, advanced-characterization and physical-security hub of the ARC network, complementing Vancouver with specialized engineering capabilities.

Circuit EditAdvanced CharacterizationTEM-STEMSilicon Security

Future Expansion

Specialized future centers built around distinct research missions.

The following markets are future ARC expansion targets and are not currently presented as operating facilities.

Future ARC

Minnesota

Materials Research Center

A second materials-focused center intended to expand research capacity, provide network redundancy and support ARC01 Vancouver.

Future ARC

Texas

Geological & Earth Materials

Planned around geological materials, mineral and earth-material research, and advanced physical characterization.

Future ARC

North Carolina

Biological & Life Sciences

Planned as the network's biological and life-sciences research specialization as ISS expands beyond its semiconductor core.

One network. Multiple specialties.

Send the question to ISS. We will route the work to the right analytical center.

Submit a Project

ARC01 · Vancouver, Washington

Structural analysis. Quantitative measurement. Failure evidence.

The Vancouver ARC is ISS's flagship center for FIB-SEM, semiconductor metrology, failure analysis and TEM-STEM workflows.

Active ARC
Vancouver ARC FIB-SEM analysis

Vancouver Specialization

Built around structural understanding and failure investigation.

FIB-SEM

Site-specific cross-sectioning, buried-feature access, serial investigation and preparation for downstream analysis.

Metrology

Critical dimensions, layer thickness, pitch, geometry and recurring process-monitoring measurements.

Failure Analysis

Evidence-driven investigation connecting symptoms with structural, material and process observations.

TEM-STEM

High-resolution internal structure, interfaces, defects and analytical characterization at nanometer-to-atomic scales.

Integrated Vancouver Workflow

Localize → Prepare → Measure → Characterize → Compare → Understand

Vancouver is designed for investigations where physical localization, controlled preparation, quantitative measurement and high-resolution microscopy must work as one coordinated path.

ARC01 · Vancouver

Start your project with the Vancouver analytical team.

Submit to Vancouver ARC

ARC02 · Queen Creek, Arizona

Modify. Characterize. Challenge. Verify.

The planned Queen Creek ARC is being positioned around circuit edit, advanced characterization, TEM-STEM and silicon security / physical assurance.

Planned ARC
Queen Creek ARC advanced characterization

Queen Creek Specialization

Built around physical modification, advanced characterization and security.

Circuit Edit

Precision cut, isolate, deposition, access and engineering-debug workflows using dedicated circuit-edit technology.

Advanced Characterization

Complementary analytical techniques including elemental, chemical and crystallographic characterization as projects require.

TEM-STEM

Nanoscale and atomic-scale imaging for device structures, interfaces, materials and security-sensitive investigations.

Silicon Security

Authorized invasive hardware assessment, physical-device assurance, secure teardown and FIB-based security validation.

Integrated Queen Creek Workflow

Define → Access → Modify / Challenge → Characterize → Verify → Report

Queen Creek is planned as a complementary ARC for projects that require active physical modification, deeper analytical characterization and authorized security evaluation.

ARC02 · Queen Creek

Discuss projects intended for the planned Arizona center.

Discuss Queen Creek ARC

About ISS

Advanced tools. Experienced people. Defensible answers.

Innovative Semiconductor Solutions is building a specialized network of Analytical Research Centers focused on helping engineers and researchers understand increasingly complex devices, materials, structures and failures across semiconductor and advanced research markets.

ISS advanced technology visualization

Built around the engineering question

The instrument is only part of the answer.

Complex semiconductor problems rarely fit neatly into a single analytical technique. ISS brings complementary preparation, imaging, spectroscopy, metrology and engineering capabilities together so customers can move through an investigation without unnecessary handoffs.

Prepare → Image → Measure → Analyze → Understand

Atomic-scale microscopy

Our Approach

Start with the question.

Understand the Objective

What happened, what changed, what must be measured and what decision must the data support?

Preserve the Evidence

Handle, prepare and document the sample in a way that protects the information it contains.

Select the Right Workflow

Choose the appropriate combination of preparation, microscopy, spectroscopy, metrology and analysis.

Communicate Clearly

Provide organized data, observations and findings engineers can use.

Scale When Required

Support both unique investigations and repeatable production-oriented analytical programs.

Protect Customer Information

Use disciplined handling and confidentiality practices for customer devices and intellectual property.

A partner, not just a lab.

See deeper. Understand more.

Talk With ISS

Careers at ISS

Join our family.

Build hands-on technical skills in a laboratory where precision, curiosity and teamwork turn complex devices into useful engineering answers.

2 Open PositionsVancouver, WashingtonFull-Time / On-Site
Semiconductor sample preparation and microscopy

Open Positions

Prep Technician Level 1

We are hiring two Prep Technician Level 1 team members for our Vancouver Analytical Research Center. This is an entry-level technical role for people who take pride in careful hands-on work and want to grow in semiconductor analysis.

2 OpeningsVancouver, WAFull-TimeOn-SiteEntry Level

What you’ll do

  • Prepare semiconductor samples for microscopy, metrology and failure-analysis workflows.
  • Perform careful mechanical preparation, mounting, grinding, polishing, cross-sectioning and related sample-preparation tasks under established procedures.
  • Document sample identity, preparation status and handoffs to maintain traceability.
  • Inspect work quality and communicate concerns before samples move to the next analytical step.
  • Maintain a clean, organized work area and support routine laboratory readiness.
  • Train on increasingly advanced preparation methods as proficiency develops.

What we’re looking for

  • Strong attention to detail and the patience to perform precision work consistently.
  • Good manual dexterity and comfort working with small devices, tools and fixtures.
  • Dependability, professional communication and the ability to follow documented procedures.
  • Basic computer skills and willingness to learn laboratory tracking systems.
  • Laboratory, manufacturing, electronics, mechanical, microscopy or technical-school experience is helpful, but not required for the right candidate.

Build a Technical Career

Start with precision. Grow with capability.

Sample Preparation

Build strong fundamentals in handling, sectioning, polishing and analytical readiness.

Advanced Preparation

Develop toward increasingly complex, site-specific and microscopy-driven preparation methods.

Microscopy & Metrology

Expand technical understanding around imaging, measurement and analytical workflows.

ARC Network Growth

Grow with a company building specialized Analytical Research Centers across multiple markets.

Equal Opportunity

ISS considers qualified applicants without regard to race, color, religion, sex, national origin, age, disability, veteran status, or other status protected by applicable law.

Ready to build something technical?

Join our family and grow with ISS.

Apply for Prep Technician Level 1

Resources

Technical information for better analytical decisions.

Explore capability documents, technical guides, application notes and sample-submission resources.

Technical microscopy resource
CAPABILITY STATEMENT

ISS Capability Statement

Overview of advanced microscopy, failure analysis, sample preparation and analytical capabilities.

Request / Download →
SECURITY

Silicon Security Capability Statement

Overview of physical-security evaluation and semiconductor assurance services.

Request / Download →
SUBMISSION

Sample Submission Guide

How to identify, document and prepare samples for ISS technical review.

View Guide →
TECHNICAL GUIDE

TEM vs. STEM

Understand what each technique reveals and when each is appropriate.

Explore →
TECHNICAL GUIDE

Understanding Site-Specific FIB Preparation

How targeted preparation connects a customer-defined feature to advanced microscopy.

Explore →
TECHNICAL GUIDE

Critical Dimension Measurement

How microscopy can support semiconductor CD and cross-sectional metrology.

Explore →

Need help selecting a technique?

You do not need to know the instrument before contacting ISS.

Submit a Project

Private Equipment Marketplace

Access to ISS equipment listings is available by request.

ISS maintains a private marketplace for qualified buyers evaluating pre-owned SEM, FIB-SEM, TEM and STEM systems. Current inventory, pricing, system configuration details and availability are shared only after access is approved.

ISS
QUALIFIED BUYERSPRIVATE INVENTORYDIRECT SALES SUPPORT

Request Access

Tell us what you are looking for.

To protect active opportunities and confidential equipment transactions, ISS no longer publishes its equipment catalog or pricing publicly. Approved buyers receive direct access to current listings and can work with ISS on configuration, logistics, installation, service and warranty options.

1. Request Access

Send your company name, equipment interest and intended application to ISS Equipment Sales.

2. Buyer Qualification

ISS confirms the request and determines which current systems are relevant to your application and facility requirements.

3. Private Review

Qualified buyers receive current availability, pricing, configuration details and direct support from ISS.

Configuration Review

ISS can review detector packages, analytical options, facility requirements and intended applications before purchase.

Logistics & Installation

Turnkey packages can include deinstallation, shipping coordination, installation, startup and acceptance support as quoted.

Service & Warranty

Warranty and service terms are defined for each system. Covered FRU parts and excluded consumables are identified in the equipment agreement.

Secure Client Access

Client Login

ISS uses client-approved SharePoint environments for secure storage and transfer of sensitive project data. Client workspaces remain protected by the access controls established for each engagement.

Secure ISS client access

Secure Data Workflow

Your project data stays in the approved environment.

Client-Approved SharePoint

Project files, reports, images and sensitive data can remain within the SharePoint environment approved for the engagement.

Controlled Access

Access is limited to authorized users and governed by the permissions established for the client workspace.

ISS Website as the Front Door

The public site provides navigation and project intake; sensitive project data does not need to be stored on the public website.

Need access?

Contact ISS and we will confirm the correct secure workspace for your project.

Contact ISS

Secure Employee Access

Employee Login

ISS employee resources are accessed through the company-approved Microsoft 365 and SharePoint environment. Use your ISS-issued credentials to access authorized internal resources.

Secure ISS employee access

Internal Access

Keep company information inside the approved environment.

Microsoft 365 & SharePoint

Internal documents, procedures and authorized employee resources remain within the company-approved Microsoft environment.

Company Credentials

Employees should use only their ISS-issued account and the access permissions assigned to their role.

Future Employee Portal

This login page is the starting point for a future employee portal that can organize SOPs, training, schedules, equipment status and internal resources without moving sensitive information onto the public website.

ISS Team Access

Continue to the approved Microsoft environment for internal resources.

Employee Sign In

Submit a Project

Tell us what you need to understand.

You do not need to know which microscope, preparation method or analytical technique your project requires. Start with the sample and engineering question.

Semiconductor project submission

Metrology Details

Circuit Edit Details

Failure Analysis Details

Sample Preparation Details

Authorized Testing Only

ISS performs physical-device security evaluation only with documented authorization from the device owner or authorized organization.

Please do not submit export-controlled, classified or otherwise restricted information unless appropriate handling arrangements have been confirmed with ISS. Do not ship samples until shipping instructions are confirmed.